|
The NanoScope IV Multimode Atomic force Microscope(AFM) /Scanning Probe Microscope (SPM)is the highest resolution SPM presently available at Kuwait
University, Faculty of Science, Science Analytical Facilities, Electron Microscopy Unit. The combination of easy to use, powerful software and
innovative hardware design gives the Multimode SPM the flexibility to easily acquire images on both the atomic and macroscopic scales. The microscope
performs the full range of SPM techniques to measure surface characteristics including topography, elasticity, friction, adhesion, magnetic fields,
and electrical fields.
|
